{"created":"2025-03-02T08:28:16.853386+00:00","id":2032319,"links":{},"metadata":{"_buckets":{"deposit":"aff0bc23-d1db-4db7-973d-309b002ccf49"},"_deposit":{"created_by":41,"id":"2032319","owner":"41","owners":[41],"pid":{"revision_id":0,"type":"depid","value":"2032319"},"status":"published"},"_oai":{"id":"oai:hiroshima.repo.nii.ac.jp:02032319","sets":["1727147343679:1730444405776:1730444407347"]},"author_link":[],"item_1617186331708":{"attribute_name":"Title","attribute_value_mlt":[{"subitem_title":"テスト不安とワーキングメモリの関係及び 筆記を用いた介入に関する研究動向","subitem_title_language":"ja"},{"subitem_title":"The Relationship Between Test Anxiety, Working Memory and Expressive Writing Interventions","subitem_title_language":"en"}]},"item_1617186419668":{"attribute_name":"Creator","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"則武, 良英","creatorNameLang":"ja"},{"creatorName":"Noritake, Yoshihide","creatorNameLang":"en"}],"familyNames":[{"familyName":"則武","familyNameLang":"ja"},{"familyName":"Noritake","familyNameLang":"en"}],"givenNames":[{"givenName":"良英","givenNameLang":"ja"},{"givenName":"Yoshihide","givenNameLang":"en"}]},{"creatorNames":[{"creatorName":"湯澤, 正通","creatorNameLang":"ja"},{"creatorName":"Yuzawa, Masamichi","creatorNameLang":"en"}],"familyNames":[{"familyName":"湯澤","familyNameLang":"ja"},{"familyName":"Yuzawa","familyNameLang":"en"}],"givenNames":[{"givenName":"正通","givenNameLang":"ja"},{"givenName":"Masamichi","givenNameLang":"en"}]}]},"item_1617186476635":{"attribute_name":"アクセス権","attribute_value_mlt":[{"subitem_access_right":"open access","subitem_access_right_uri":"http://purl.org/coar/access_right/c_abf2"}]},"item_1617186609386":{"attribute_name":"Subject","attribute_value_mlt":[{"subitem_subject":"test anxiety","subitem_subject_scheme":"Other"},{"subitem_subject":"working memory","subitem_subject_scheme":"Other"},{"subitem_subject":"emotinal regulation","subitem_subject_scheme":"Other"},{"subitem_subject":"expressive writing","subitem_subject_scheme":"Other"},{"subitem_subject":"テスト不安","subitem_subject_scheme":"Other"},{"subitem_subject":"ワーキングメモリ","subitem_subject_scheme":"Other"},{"subitem_subject":"感情制御","subitem_subject_scheme":"Other"},{"subitem_subject":"筆記開示","subitem_subject_scheme":"Other"},{"subitem_subject":"370","subitem_subject_scheme":"NDC"}]},"item_1617186626617":{"attribute_name":"Description","attribute_value_mlt":[{"subitem_description":"This paper reviewed the resent research about the behavioral and cognitive effects of negative emotions on performance. The relationship between negative emotions (e.g., test anxiety, pressure-induced worry, and stereotype threat), working memory, emotional regulation, and short expressive writing interventions was considered. The following suggestions were acquired: (1) negative emotions temporarily decrease the capacity of working memory to affect the task performances during the test situations; (2) maladaptive emotional regulation decreases working memory capacity; (3) reappraisal is an adaptive and effective emotional regulation strategy for handling negative emotions in testing situations; and (4) short expressive writing facilitates reappraisal and improves temporary working memory capacity if the individuals felt negative emotions during the test situation. Short benefits-focused writing is another effective intervention for managing negative emotions during test situations; this strategy could alleviate younger people’s test anxiety. However short expressive writing is not necessarily usually effective for handling negative emotions, could be effective under some conditions. Future studies are necessary to identifying these specific conditions, including age, context, task types, and instances of anxiety.","subitem_description_language":"en"}]},"item_1617186643794":{"attribute_name":"Publisher","attribute_value_mlt":[{"subitem_publisher":"広島大学大学院教育学研究科"}]},"item_1617186702042":{"attribute_name":"Language","attribute_value_mlt":[{"subitem_language":"jpn"}]},"item_1617186819068":{"attribute_name":"identifier_registration","attribute_value_mlt":[{"subitem_identifier_reg_text":"10.15027/46827","subitem_identifier_reg_type":"JaLC"}]},"item_1617186920753":{"attribute_name":"Source Identifier","attribute_value_mlt":[{"subitem_source_identifier":"1346-5562","subitem_source_identifier_type":"ISSN"},{"subitem_source_identifier":"AA11625039","subitem_source_identifier_type":"NCID"}]},"item_1617187024783":{"attribute_name":"開始ページ","attribute_value_mlt":[{"subitem_start_page":"201"}]},"item_1617187056579":{"attribute_name":"bibliographic_information","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2018-12-21","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"67","bibliographicPageEnd":"209","bibliographicPageStart":"201","bibliographic_titles":[{"bibliographic_title":"広島大学大学院教育学研究科紀要. 第三部, 教育人間科学関連領域"},{"bibliographic_title":"Bulletin of the Graduate School of Education, Hiroshima University. Part 3, Education and human science"}]}]},"item_1617258105262":{"attribute_name":"item_1617258105262","attribute_value_mlt":[{"resourcetype":"departmental bulletin paper","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_1617265215918":{"attribute_name":"出版タイプ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_970fb48d4fbd8a85","subitem_version_type":"VoR"}]},"item_1617605131499":{"attribute_name":"File","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_access","date":[{"dateType":"Available","dateValue":"2023-03-18"}],"displaytype":"simple","filename":"BullGradSchEducHU-Part3_67_201.pdf","filesize":[{"value":"1.2 MB"}],"mimetype":"application/pdf","url":{"objectType":"fulltext","url":"https://hiroshima.repo.nii.ac.jp/record/2032319/files/BullGradSchEducHU-Part3_67_201.pdf"},"version_id":"9d6c14fd-9e30-49de-b8cf-5111bd22b6f8"}]},"item_1732771732025":{"attribute_name":"旧ID","attribute_value":"46827"},"item_title":"テスト不安とワーキングメモリの関係及び 筆記を用いた介入に関する研究動向","item_type_id":"40003","owner":"41","path":["1730444407347"],"pubdate":{"attribute_name":"PubDate","attribute_value":"2023-03-18"},"publish_date":"2023-03-18","publish_status":"0","recid":"2032319","relation_version_is_last":true,"title":["テスト不安とワーキングメモリの関係及び 筆記を用いた介入に関する研究動向"],"weko_creator_id":"41","weko_shared_id":-1},"updated":"2025-03-02T08:28:33.597150+00:00"}