{"created":"2025-02-21T06:11:32.173931+00:00","id":2011644,"links":{},"metadata":{"_buckets":{"deposit":"153858d1-dedd-47de-aaf8-f33c851005f4"},"_deposit":{"created_by":41,"id":"2011644","owners":[41],"pid":{"revision_id":0,"type":"depid","value":"2011644"},"status":"published"},"_oai":{"id":"oai:hiroshima.repo.nii.ac.jp:02011644","sets":["1730444907710"]},"author_link":[],"item_1617186331708":{"attribute_name":"Title","attribute_value_mlt":[{"subitem_title":"蛍光X線法による微量元素分析とイメージング","subitem_title_language":"ja"},{"subitem_title":"X-ray Fluorescence Method for Trace Analysis and Imaging","subitem_title_language":"en"}]},"item_1617186419668":{"attribute_name":"Creator","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"早川, 慎二郎","creatorNameLang":"ja"},{"creatorName":"Hayakawa, Shinjiro","creatorNameLang":"en"}],"familyNames":[{"familyName":"早川","familyNameLang":"ja"},{"familyName":"Hayakawa","familyNameLang":"en"}],"givenNames":[{"givenName":"慎二郎","givenNameLang":"ja"},{"givenName":"Shinjiro","givenNameLang":"en"}]}]},"item_1617186476635":{"attribute_name":"Access Rights","attribute_value_mlt":[{"subitem_access_right":"open access","subitem_access_right_uri":"http://purl.org/coar/access_right/c_abf2"}]},"item_1617186499011":{"attribute_name":"Rights","attribute_value_mlt":[{"subitem_rights":"Copyright (c) 2000 The Japanese Society for Synchrotron Radiation Research"}]},"item_1617186609386":{"attribute_name":"Subject","attribute_value_mlt":[{"subitem_subject":"430","subitem_subject_scheme":"NDC"}]},"item_1617186626617":{"attribute_name":"Description","attribute_value_mlt":[{"subitem_description":"X-ray fluorescence analysis has a long history as a conventional bulk elemental analysis with medium sensitivity. However, with the use of synchrotron radiation x-ray fluorescence method has become a unique analytical technique which can provide trace elemental information with the spatial resolution. To obtain quantitative information of trace elemental distribution by using the x-ray fluorescence method, theoretical description of x-ray fluorescence yield is described. Moreover, methods and instruments for trace characterization with a scanning x-ray microprobe are described.","subitem_description_language":"en"}]},"item_1617186643794":{"attribute_name":"Publisher","attribute_value_mlt":[{"subitem_publisher":"日本放射光学会"}]},"item_1617186702042":{"attribute_name":"Language","attribute_value_mlt":[{"subitem_language":"jpn"}]},"item_1617186920753":{"attribute_name":"Source Identifier","attribute_value_mlt":[{"subitem_source_identifier":"0914-9287","subitem_source_identifier_type":"ISSN"},{"subitem_source_identifier":"AN10075706","subitem_source_identifier_type":"NCID"}]},"item_1617187024783":{"attribute_name":"Page Start","attribute_value_mlt":[{"subitem_start_page":"313"}]},"item_1617187056579":{"attribute_name":"Bibliographic Information","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2000-08-31","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"4","bibliographicPageEnd":"318","bibliographicPageStart":"313","bibliographicVolumeNumber":"13","bibliographic_titles":[{"bibliographic_title":"放射光"},{"bibliographic_title":"放射光"}]}]},"item_1617258105262":{"attribute_name":"Resource Type","attribute_value_mlt":[{"resourcetype":"journal article","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_1617265215918":{"attribute_name":"Version Type","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_970fb48d4fbd8a85","subitem_version_type":"VoR"}]},"item_1617605131499":{"attribute_name":"File","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_access","date":[{"dateType":"Available","dateValue":"2023-03-18"}],"displaytype":"simple","filename":"JSSRR_13_313.pdf","filesize":[{"value":"688.2 KB"}],"mimetype":"application/pdf","url":{"objectType":"fulltext","url":"https://hiroshima.repo.nii.ac.jp/record/2011644/files/JSSRR_13_313.pdf"},"version_id":"a24e22ce-fbd1-4733-a54b-1523b30fdfbd"}]},"item_1732771732025":{"attribute_name":"旧ID","attribute_value":"30483"},"item_title":"蛍光X線法による微量元素分析とイメージング","item_type_id":"40003","owner":"41","path":["1730444907710"],"pubdate":{"attribute_name":"PubDate","attribute_value":"2023-03-18"},"publish_date":"2023-03-18","publish_status":"0","recid":"2011644","relation_version_is_last":true,"title":["蛍光X線法による微量元素分析とイメージング"],"weko_creator_id":"41","weko_shared_id":-1},"updated":"2025-02-22T11:20:11.508193+00:00"}