{"created":"2025-02-21T02:30:27.480033+00:00","id":2006024,"links":{},"metadata":{"_buckets":{"deposit":"ca754fe6-f4ae-49b0-b1a1-652ebd8a59f7"},"_deposit":{"created_by":41,"id":"2006024","owner":"41","owners":[41],"pid":{"revision_id":0,"type":"depid","value":"2006024"},"status":"published"},"_oai":{"id":"oai:hiroshima.repo.nii.ac.jp:02006024","sets":["1730444908512:1730444916333"]},"author_link":[],"item_1617186331708":{"attribute_name":"Title","attribute_value_mlt":[{"subitem_title":"Current Oscillations and Domain Instability in Semiconductors","subitem_title_language":"en"},{"subitem_title":"半導体における電流振動とドメイン不安定性","subitem_title_language":"ja"}]},"item_1617186419668":{"attribute_name":"Creator","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"生塩, 研一","creatorNameLang":"ja"},{"creatorName":"Oshio, Ken-ichi","creatorNameLang":"en"}],"familyNames":[{"familyName":"生塩","familyNameLang":"ja"},{"familyName":"Oshio","familyNameLang":"en"}],"givenNames":[{"givenName":"研一","givenNameLang":"ja"},{"givenName":"Ken-ichi","givenNameLang":"en"}]}]},"item_1617186476635":{"attribute_name":"Access Rights","attribute_value_mlt":[{"subitem_access_right":"open access","subitem_access_right_uri":"http://purl.org/coar/access_right/c_abf2"}]},"item_1617186499011":{"attribute_name":"Rights","attribute_value_mlt":[{"subitem_rights":"Copyright(c) by Author"}]},"item_1617186609386":{"attribute_name":"Subject","attribute_value_mlt":[{"subitem_subject":"540","subitem_subject_scheme":"NDC"}]},"item_1617186626617":{"attribute_name":"Description","attribute_value_mlt":[{"subitem_description":"Abstract / p2  Contents / p4  1 Introduction / p1  　1.1 Negative Differential Conductivity(NDC) / p2  　1.2 Gunn effect / p3  　1.3 Gunn effect with impact ionization / p6  　1.4 Recombination instability / p7  　1.5 Chaos in semiconductors / p8  　1.6 Composition of following chapters / p9  2 Chaotic current oscillations in the Gunn-effect device under the dc and the rf bias voltages / p13  　2.1 Introduction / p13  　2.2 Equations of motion and the method of solution / p14  　2.3 The motion under the dc bias voltage / p18  　2.4 The motion under the dc and rf bias voltage / p20  3 Non-periodic current oscillations in the Gunn-effect device with the impact-ionization effect / p33  　3.1 Introduction / p33  　3.2 Equations of motion and the method of solution / p34  　3.3 Simulational results / p38  4 Current oscillations induced by recombination instability in semiconductors / p49  　4.1 Introduction / p49  　4.2 Equations of motion and simulation method / p49  　4.3 Simulational results / p54  5 Summary and conclusion / p71","subitem_description_type":"TableOfContents"}]},"item_1617186702042":{"attribute_name":"Language","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_1617186819068":{"attribute_name":"Identifier Registration","attribute_value_mlt":[{"subitem_identifier_reg_text":"10.11501/3119766","subitem_identifier_reg_type":"JaLC"}]},"item_1617187024783":{"attribute_name":"Page Start","attribute_value_mlt":[{"subitem_start_page":"1"}]},"item_1617187056579":{"attribute_name":"Bibliographic Information","attribute_value_mlt":[{"bibliographicPageStart":"1"}]},"item_1617187087799":{"attribute_name":"Dissertation Number","attribute_value_mlt":[{"subitem_dissertationnumber":"甲第1436号"}]},"item_1617187112279":{"attribute_name":"Degree Name","attribute_value_mlt":[{"subitem_degreename":"博士(理学)","subitem_degreename_language":"ja"},{"subitem_degreename":"Physical Science","subitem_degreename_language":"en"}]},"item_1617187136212":{"attribute_name":"Date Granted","attribute_value_mlt":[{"subitem_dategranted":"1996-03-26"}]},"item_1617258105262":{"attribute_name":"Resource Type","attribute_value_mlt":[{"resourcetype":"doctoral thesis","resourceuri":"http://purl.org/coar/resource_type/c_db06"}]},"item_1617265215918":{"attribute_name":"Version Type","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_be7fb7dd8ff6fe43","subitem_version_type":"NA"}]},"item_1617605131499":{"attribute_name":"File","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_access","date":[{"dateType":"Available","dateValue":"2023-03-18"}],"displaytype":"simple","filename":"diss_ko1436.pdf","filesize":[{"value":"47.1 MB"}],"mimetype":"application/pdf","url":{"objectType":"fulltext","url":"https://hiroshima.repo.nii.ac.jp/record/2006024/files/diss_ko1436.pdf"},"version_id":"2221757e-9794-4ee9-aa1a-5159705fcb18"}]},"item_1617944105607":{"attribute_name":"Degree Grantor","attribute_value_mlt":[{"subitem_degreegrantor":[{"subitem_degreegrantor_language":"ja","subitem_degreegrantor_name":"広島大学"}],"subitem_degreegrantor_identifier":[{"subitem_degreegrantor_identifier_name":"15401","subitem_degreegrantor_identifier_scheme":"kakenhi"}]},{"subitem_degreegrantor":[{"subitem_degreegrantor_language":"en","subitem_degreegrantor_name":"Hiroshima University"}]}]},"item_1732771732025":{"attribute_name":"旧ID","attribute_value":"33801"},"item_title":"Current Oscillations and Domain Instability in Semiconductors","item_type_id":"40003","owner":"41","path":["1730444916333"],"pubdate":{"attribute_name":"PubDate","attribute_value":"2023-03-18"},"publish_date":"2023-03-18","publish_status":"0","recid":"2006024","relation_version_is_last":true,"title":["Current Oscillations and Domain Instability in Semiconductors"],"weko_creator_id":"41","weko_shared_id":-1},"updated":"2025-02-21T02:30:48.428970+00:00"}