{"created":"2025-02-18T01:41:20.196665+00:00","id":2000968,"links":{},"metadata":{"_buckets":{"deposit":"e7ac70a9-15da-4bc4-837f-7f0d3615da0c"},"_deposit":{"created_by":41,"id":"2000968","owners":[41],"pid":{"revision_id":0,"type":"depid","value":"2000968"},"status":"published"},"_oai":{"id":"oai:hiroshima.repo.nii.ac.jp:02000968","sets":["1730444917621"]},"author_link":[],"item_1617186331708":{"attribute_name":"Title","attribute_value_mlt":[{"subitem_title":"Reliability Investigation of Automatic Assessment of Learner-Build Concept Map with Kit-Build Method by Comparing with Manual Methods","subitem_title_language":"en"}]},"item_1617186419668":{"attribute_name":"Creator","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"Wunnasri, Warunya","creatorNameLang":"en"}],"familyNames":[{"familyName":"Wunnasri","familyNameLang":"en"}],"givenNames":[{"givenName":"Warunya","givenNameLang":"en"}]},{"creatorNames":[{"creatorName":"Pailai, Jaruwat","creatorNameLang":"en"}],"familyNames":[{"familyName":"Pailai","familyNameLang":"en"}],"givenNames":[{"givenName":"Jaruwat","givenNameLang":"en"}]},{"creatorNames":[{"creatorName":"Hayashi, Yusuke","creatorNameLang":"en"}],"familyNames":[{"familyName":"Hayashi","familyNameLang":"en"}],"givenNames":[{"givenName":"Yusuke","givenNameLang":"en"}]},{"creatorNames":[{"creatorName":"Hirashima, Tsukasa","creatorNameLang":"en"}],"familyNames":[{"familyName":"Hirashima","familyNameLang":"en"}],"givenNames":[{"givenName":"Tsukasa","givenNameLang":"en"}]}]},"item_1617186476635":{"attribute_name":"Access Rights","attribute_value_mlt":[{"subitem_access_right":"open access","subitem_access_right_uri":"http://purl.org/coar/access_right/c_abf2"}]},"item_1617186499011":{"attribute_name":"Rights","attribute_value_mlt":[{"subitem_rights":"The final authenticated version is available online at https://doi.org/10.1007/978-3-319-61425-0_35."},{"subitem_rights":"This is not the published version. Please cite only the published version. この論文は出版社版でありません。引用の際には出版社版をご確認ご利用ください。"}]},"item_1617186609386":{"attribute_name":"Subject","attribute_value_mlt":[{"subitem_subject":"Concept map assessment method","subitem_subject_scheme":"Other"},{"subitem_subject":"Kit-Build concept map","subitem_subject_scheme":"Other"},{"subitem_subject":"Reliability","subitem_subject_scheme":"Other"},{"subitem_subject":"370","subitem_subject_scheme":"NDC"}]},"item_1617186626617":{"attribute_name":"Description","attribute_value_mlt":[{"subitem_description":"This paper describes an investigation into the reliability of an automatic assessment method of the learner-build concept map by comparing it with two well-known manual methods. We have previously proposed the Kit-Build (KB) concept map framework where a learner builds a concept map by using only a provided set of components, known as the set \"kit\". In this framework, instant and automatic assessment of a learner-build concept map has been realized. We call this assessment method the \"Kit-Build method\" (KB method). The framework and assessment method have already been practically used in classrooms in various schools. As an investigation of the reliability of this method, we have conducted an experiment to compare the assessment results of the method with the assessment results of two other manual assessment methods. In this experiment, 22 university students attended as subjects and four as raters. It was found that the scores of the KB method had a very strong correlation with the scores of the other manual methods. The results suggest that automatic assessment of the Kit-Build concept map can attain almost the same level of reliability as well-known manual assessment methods.","subitem_description_language":"en"},{"subitem_description":"'Artificial Intelligence in Education' 18th International Conference, AIED 2017, Wuhan, China, June 28 – July 1, 2017, Proceedings","subitem_description_type":"Other"}]},"item_1617186643794":{"attribute_name":"Publisher","attribute_value_mlt":[{"subitem_publisher":"Springer, Cham"}]},"item_1617186702042":{"attribute_name":"Language","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_1617186920753":{"attribute_name":"Source Identifier","attribute_value_mlt":[{"subitem_source_identifier":"0302-9743","subitem_source_identifier_type":"ISSN"},{"subitem_source_identifier":"1611-3349","subitem_source_identifier_type":"ISSN"}]},"item_1617187024783":{"attribute_name":"Page Start","attribute_value_mlt":[{"subitem_start_page":"418"}]},"item_1617187056579":{"attribute_name":"Bibliographic Information","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2017","bibliographicIssueDateType":"Issued"},"bibliographicPageEnd":"429","bibliographicPageStart":"418","bibliographicVolumeNumber":"10331","bibliographic_titles":[{"bibliographic_title":"Lecture Notes in Computer Science"},{"bibliographic_title":"Lecture Notes in Computer Science"}]}]},"item_1617258105262":{"attribute_name":"Resource Type","attribute_value_mlt":[{"resourcetype":"conference paper","resourceuri":"http://purl.org/coar/resource_type/c_5794"}]},"item_1617265215918":{"attribute_name":"Version Type","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_b1a7d7d4d402bcce","subitem_version_type":"AO"}]},"item_1617353299429":{"attribute_name":"Relation","attribute_value_mlt":[{"subitem_relation_type_id":{"subitem_relation_type_id_text":"978-3-319-61424-3","subitem_relation_type_select":"ISBN"}},{"subitem_relation_type_id":{"subitem_relation_type_id_text":"978-3-319-61425-0","subitem_relation_type_select":"ISBN"}},{"subitem_relation_type_id":{"subitem_relation_type_id_text":"10.1007/978-3-319-61425-0_35","subitem_relation_type_select":"DOI"}}]},"item_1617605131499":{"attribute_name":"File","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_access","date":[{"dateType":"Available","dateValue":"2023-03-18"}],"displaytype":"simple","filename":"AIED2017_418.pdf","filesize":[{"value":"533.4 KB"}],"mimetype":"application/pdf","url":{"objectType":"fulltext","url":"https://hiroshima.repo.nii.ac.jp/record/2000968/files/AIED2017_418.pdf"},"version_id":"5c315725-8fe9-409f-b06b-fc6caed654af"}]},"item_1732771732025":{"attribute_name":"旧ID","attribute_value":"46326"},"item_title":"Reliability Investigation of Automatic Assessment of Learner-Build Concept Map with Kit-Build Method by Comparing with Manual Methods","item_type_id":"40003","owner":"41","path":["1730444917621"],"pubdate":{"attribute_name":"PubDate","attribute_value":"2023-03-18"},"publish_date":"2023-03-18","publish_status":"0","recid":"2000968","relation_version_is_last":true,"title":["Reliability Investigation of Automatic Assessment of Learner-Build Concept Map with Kit-Build Method by Comparing with Manual Methods"],"weko_creator_id":"41","weko_shared_id":-1},"updated":"2025-02-18T03:04:06.005755+00:00"}